One 9-volt battery


Even though each atom in a piece of material tends to hold together as a unit, there's actually a lot of empty space between the electrons and the cluster of protons and neutrons residing in the middle.
This crude model is that of the element carbon, with six protons, six neutrons, and six electrons. In any atom, the protons and neutrons are very tightly bound together, which is an important quality. The tightly-bound clump of protons and neutrons in the center of the atom is called the nucleus, and the number of protons in an atom's nucleus determines its elemental identity: change the number of protons in an atom's nucleus, and you change the type of atom that it is. In fact, if you could remove three protons from the nucleus of an atom of lead, you will have achieved the old alchemists' dream of producing an atom of gold! The tight binding of protons in the nucleus is responsible for the stable identity of chemical elements, and the failure of alchemists to achieve their dream.
Neutrons are much less influential on the chemical character and identity of an atom than protons, although they are just as hard to add to or remove from the nucleus, being so tightly bound. If neutrons are added or gained, the atom will still retain the same chemical identity, but its mass will change slightly and it may acquire strange nuclear properties such as radioactivity.
However, electrons have significantly more freedom to move around in an atom than either protons or neutrons. In fact, they can be knocked out of their respective positions (even leaving the atom entirely!) by far less energy than what it takes to dislodge particles in the nucleus. If this happens, the atom still retains its chemical identity, but an important imbalance occurs. Electrons and protons are unique in the fact that they are attracted to one another over a distance. It is this attraction over distance which causes the attraction between rubbed objects, where electrons are moved away from their original atoms to reside around atoms of another object.
Electrons tend to repel other electrons over a distance, as do protons with other protons. The only reason protons bind together in the nucleus of an atom is because of a much stronger force called the strong nuclear force which has effect only under very short distances. Because of this attraction/repulsion behavior between individual particles, electrons and protons are said to have opposite electric charges. That is, each electron has a negative charge, and each proton a positive charge. In equal numbers within an atom, they counteract each other's presence so that the net charge within the atom is zero. This is why the picture of a carbon atom had six electrons: to balance out the electric charge of the six protons in the nucleus. If electrons leave or extra electrons arrive, the atom's net electric charge will be imbalanced, leaving the atom "charged" as a whole, causing it to interact with charged particles and other charged atoms nearby. Neutrons are neither attracted to or repelled by electrons, protons, or even other neutrons, and are consequently categorized as having no charge at all.
The process of electrons arriving or leaving is exactly what happens when certain combinations of materials are rubbed together: electrons from the atoms of one material are forced by the rubbing to leave their respective atoms and transfer over to the atoms of the other material. In other words, electrons comprise the "fluid" hypothesized by Benjamin Franklin. The operational definition of a coulomb as the unit of electrical charge (in terms of force generated between point charges) was found to be equal to an excess or deficiency of about 6,250,000,000,000,000,000 electrons. Or, stated in reverse terms, one electron has a charge of about 0.00000000000000000016 coulombs. Being that one electron is the smallest known carrier of electric charge, this last figure of charge for the electron is defined as the elementary charge.
The result of an imbalance of this "fluid" (electrons) between objects is called static electricity. It is called "static" because the displaced electrons tend to remain stationary after being moved from one material to another. In the case of wax and wool, it was determined through further experimentation that electrons in the wool actually transferred to the atoms in the wax, which is exactly opposite of Franklin's conjecture! In honor of Franklin's designation of the wax's charge being "negative" and the wool's charge being "positive," electrons are said to have a "negative" charging influence. Thus, an object whose atoms have received a surplus of electrons is said to be negatively charged, while an object whose atoms are lacking electrons is said to be positively charged, as confusing as these designations may seem. By the time the true nature of electric "fluid" was discovered, Franklin's nomenclature of electric charge was too well established to be easily changed, and so it remains to this day.
Because silicon has a higher absorption for green light than for near-IR, most manufacturers of laser wafer markers now offer frequency-doubled solid-state lasers as an option--or, as in the case of NEC Corp., as standard equipment. The disadvantages of a frequency-doubled laser--lower power and higher cost--can be offset by improved marking performance resulting from the fact that energy absorption of the doubled light occurs closer to the wafer surface. But the choice between green and near-IR is not clear-cut. Because each IC chip maker has developed its own proprietary methods, what works well at one fab may not pass muster at another.
In the case of backside die marking, the consequence of silicon`s lower near-IR absorption is more obvious. Although opaque to the eye, a silicon wafer transmits enough of the Nd:YAG laser`s 1064-nm fundamental wavelength that a small amount of light can reach all the way to the underside of the die itself, potentially causing damage. But damage of this sort "is uncommon," says Downes of General Scanning. He notes that of all the chips being manufactured at fabs where backside marking is used, only one type of chip at one fab suffered performance degradation due to underside irradiation. Even so, General Scanning offers optional frequency doubling of its lasers, he says.
When operating at high power and slow scan speeds, laser wafer-marking systems are capable of digging pits and trenches in silicon with depths of from a few to more than 100 µm, called "hard" marks. But this sort of marking creates particles that contaminate and ruin chips. In addition, when used for backside die ID, hard marking can produce raised kerfs up to 30 µm high that prevent a finished chip from adequately contacting its heat sink.
ABSTRACT:Some of the critical issues of wafer level chip scale package (WLCSP) are mentioned and discussed in this investigation. Emphasis is placed on the cost analysis of WLCSP through the important parameters such as wafer-level redistribution, wafer-bumping, and wafer-level underfilling. Useful and simple equations in terms of these parameters are also provided. Only solder-bumped with pad-redistribution WLCSPs are considered in this study.
INTRODUCTION:There are at least two major reasons why directly attaching the solder bumped flip chip on organic substrates is not popular yet [1, 2]. Because of the thermal expansion mismatch between the silicon chip and the epoxy PCB, underfill encapsulant is usually needed for solder joint reliability. However, due to the underfill operation, the manufacturing cost is increased and the manufacturing throughput is reduced. In addition, the rework of an underfilled flip chip on PCB is very difficult, if it is not impossible.
The other reason is because the pitch and size of the pads on the peripheral-arrayed chips are very small and pose great demands on the supporting PCB. The high-density PCBs with sequential build-up circuits connected through microvias are not commonly available at reasonable cost yet.
Meantime, a new class of packaging called wafer level chip scale package (WLCSP) provides a solution to these problems [1 – 15]. There are many different kinds of WLCSP, for examples, eight different (ChipScale, EPIC, FCT, Fujitsu, Mitsubishi, National Semiconductor, Sandia National Laboratories, and ShellCase) companies’ WLCSP are reported in [2] and six different (EPS/APTOS, Amkor/Anam, Hyundai, FormFactor, Tessera, and Oxford) companies’ WLCSP are reported in [1]. Just like many other new technologies,
The infrastructure of WLCSP is not well established
The standard of WLCSP is not well established
WLCSP expertise is not commonly available
Bare wafer is not commonly available
Bare wafer handling is delicate
High cost for poor-yield IC wafers
Wafer bumping is still too costly
High cost for low wafer-bumping yield, especially for high-cost dies
Wafer-level redistribution is still too costly
High cost for low wafer-level redistribution yield, especially for high-cost dies
Troubles with System Makers if the die shrinks
Test at speed and burn-in at high temperature on a wafer are difficult
Single-point touch-up on the wafer is difficult
PCB assembly of WLCSP is more difficult
Solder joint reliability is more critical
Alpha particles produce soft errors by penetrating through the lead-bearing solder on WLCSP
Impact of lead-free solder regulations on WLCSP
Who should do the WLCSP? IC Foundries or Bump Houses?
What are the cost-effective and reliable WLCSPs and for what IC devices?
How large is the WLCSP market?
What is the life cycle of WLCSP?
WLCSP COSTS
Since 100% perfect wafers cannot be made at high volume today, the true IC chip yield (YT) plays the most important role in cost analysis. Also, the physical possible number of undamaged chips (Nc) stepped from a wafer is need for cost analysis, since (YTNc) is the number of truly good die on a wafer. Nc is given by [1, 2, 16]
where
A = xy (2)
and
In Equations (1) – (3), x and y are the dimensions of a rectangular chip (in millimeters, mm) with x no less than y; q is the ratio between x and y; f is the wafer diameter (mm); and A is the area of the chip (in square millimeters, mm2). For example, for a 200 mm wafer with A = 10 x 10 = 100 mm2, then Nc ~
Wafer Redistribution Costs
Wafer-level redistribution is the heart of the WLCSPs. The cost of wafer-level redistribution is affected by the true yield (YT) of the IC chip, the wafer-level redistribution yield (YR), and the good die cost (CD). The actual wafer-level redistribution cost per wafer (CR) is:
CR=CWR+(1–YR)YTNCCD (4)
where CWR is the wafer-level redistribution cost per wafer (ranging from $50 to $200), YR is the wafer-level redistribution yield per wafer, CD is the good die cost (not the cost of an individual die on the wafer), Nc is given in Equation (1), and YT is the true IC chip yield after at-speed/burn-in system tests (or individual die yield). Again, it can be seen that the actual wafer-level redistribution cost per wafer depends not only on the wafer-level redistribution cost per wafer but also on the true IC chip yield per wafer, wafer-level redistribution yield per wafer, and good die cost.
Wafer-level redistribution yield (YR) plays a very important role in WLCSP. The wafer-level redistribution yield loss (1-YR) could be due to: (1) more process steps; (2) wafer breakage; (3) wafer warping; (4) process defects such as spots of contamination or irregularities on the wafer surface; (5) mask defects such as spot, hole, inclusion, protrusion, break, and bridge; (6) feature-size distortions; (7) pattern mis-registration; (8) lack of resist adhesion; (9) over etch; (10) undercutting; (11) incomplete etch; and (12) wrong materials. It should be noted that wafer-level redistribution are not reworkable. It has to be right the first time, otherwise, someone has to pay for it!
The uses of Equations (1) and (4) are shown in the following examples. If the die size of a 200 mm wafer is 100 mm2, true IC chip yield per wafer is 80% (since the importance of YT has been shown in [16, 17], only one value of YT will be consider in this study), wafer-level redistribution yield per wafer is 90%, wafer-level redistribution cost per wafer is $100, and the die cost is $100 (e.g., microprocessors), then from Equation (1), Nc = 255, and from Equation (4), the actual wafer-level redistribution cost per wafer is $2140. For the same size of wafer if the die cost is $5 (e.g., memory devices), then the actual wafer-level redistribution cost per wafer is $202. It is noted that for both cases, the actual wafer-level redistribution cost per wafer is much higher than the wafer-level redistribution cost (CWR = $100)!
On the other hand, if the wafer-level redistribution yield is increased from 90% to 99%, then the actual cost for redistributing the microprocessors wafer is reduced from $2140 to $304 and for redistributing the memory wafer is reduced from $202 to $110.2. Thus, wafer-level redistribution yield plays an important role in the cost of wafer-level redistribution and the wafer-level redistribution houses should stride to make YR > 99%, especially for expensive good dies
Wafer Bumping Costs
Wafer bumping is the heart of solder-bumped WLCSPs. The cost of wafer bumping is affected by YT, CD, YR and the wafer-bumping yield (YB). The actual wafer bumping cost per wafer (CB) is:
CB=CWB+(1–YB)YRYTNCCD (5)
where CWB is the wafer bumping cost per wafer (ranging from $25 to $250), YB is the wafer-bumping yield per wafer, YR is the wafer-level redistribution yield per wafer, CD is the good die cost, Nc is given in Equation (1), and YT is the true IC chip yield after at-speed/burn-in system tests (or individual die yield). Again, it can be seen that the actual wafer bumping cost per wafer depends not only on the wafer-bumping cost per wafer but also on the true IC chip yield per wafer, wafer-bumping yield per wafer, good die cost, and wafer-level redistribution yield per wafer.
Just like YR, wafer bumping yield (YB) plays a very important role in wafer bumping. The wafer bumping yield loss (1-YB) could be due to: (1) wrong process;, (2) different materials; (3) too tall or short of a bump height; (4) not enough shear strength; (5) un-even shear strength; (6) broken wafers or dies; (7) solder bridging; (8) damaged bumps; (9) missing bumps; and (10) scratch of the wafer.
For the pervious example, if the wafer-bumping yield per wafer is 90% and wafer bumping cost per wafer is $120, then the actual wafer bumping costs per (the microprocessors) wafer are, respectively, $1956 if YR = 90% and $2139.6 if YR = 99%, and the actual wafer bumping costs per (the memory) wafer are, respectively, $211.8 if YR = 90% and $220.98 if YR = 99%. Again, it should be noted that the actual wafer-bumping cost per wafer is much higher than the wafer-bumping cost (CWB = $120).
On the other hand, if the wafer-bumping yield is increased from 90% to 99%, then the actual costs for bumping the microprocessors wafer are, respectively, $303.6 if YR = 90% and $321.96 if YR = 99%, and the actual costs for bumping the memory wafer are, respectively, $129.18 if YR = 90% and $130.1 if YR = 99%. Thus, wafer-bumping yield plays an important role in the cost of wafer bumping and the wafer bumping houses should stride to make YBYR > 99%, especially for expensive good dies. If there is no wafer-level redistribution, then there is no wafer redistribution yield loss, i.e., YR = 1, then Equation (5)
SUMMARY
More than 20 different critical issues of WLCSP have been mentioned. The most important issue (cost) of WLCSP has been analyzed in terms of the true IC chip yield, wafer-level redistribution yield, wafer-bumping yield, wafer-level underfill yield, and die size and cost. Also, useful equations in terms of these parameters have been presented and demonstrated through examples. Some important results are summarized as follows.
IC chip yield (YT) plays the most important role in WLCSP. If YT is low for a particular IC device, then it is not cost-effective to house the IC with WLCSP, unless it is compensated for by performance, density, and form factor.
Wafer-level redistribution yield (YR) plays the second most important role in WLCSP. Since this is the first post wafer processing after the IC FAB, the wafer-level redistribution houses should stride to make YR > 99% (99.9% is preferred). Otherwise, it will make the subsequent steps very expensive by wasting the material and process on the damage dies.
Wafer-bumping yield (YB) plays the third most important role in WLCSP. The wafer bumping house should strive to make YRYB > 99% (99.9% is preferred) to minimize the hidden cost, since they cannot afford to damage the already redistributed good dies.
Based on cost and process points of view, wafer-level underfill is not a good idea for solder-bumped flip chip on low-cost substrates.